Study on nano-scale materials electrical characteristics are usually a combination of detection and microscopy on interesting points for the measurement uncertainty.
However, you must consider an additional factor is the pressure exerted by the probe on the test results, because many materials with pressure dependency, pressure causes the electrical characteristics of great changes occurred.Now, a new measurement technique to nano-materials for electrical and mechanical characteristics expressed as a function of pressure exerted probes, to reveal the Nano before cannot see.
The nano-level electrical contact resistance measurement tool (United States, Minnesota, Minneapolis city Hysitron company launched nanoECR?) to highly managed load or replacement contact conditions for on-site measurement of electrical and mechanical characteristics. This technology offers a variety of measurements of time-based dependencies, including stress, displacement, current and voltage, greatly increases our ability to from traditional measurement of nano-probes in the amount of information. This measurement is from the various types of nano-materials and devices with a variety of parameters extracted.Discover, understand and control the performance of nano-materials with unique properties is the contemporary scientific studies of the HotSpot.
Grasp their mechanical properties, electrical properties and distortion between for designing next-generation materials and devices is essential. NanoECR systems contribute to these areas, can be used to study of nano-material pressure results of phase shift, diode acts, tunneling effect, such as the phenomenon of piezoelectric response.New measurement methods
The diversity of nano-technology applied to the coupling measurements and electrical measurement of machinery, while achieving high accuracy, repeatability and probe positioning, made a number of special challenges.
According to probe/samples of contact status, current levels from a couple of pA to several mA, voltage level from several? V to V, the pressure exerted by the probe as a few from several nN mN, probe displacement from a few? To several? m. Furthermore, Nano-contact unique geometric dimensions, we face many challenges.For these reasons, Hysitron company developed a set of integrated Hysitron TriboIndenter? Nano-mechanical Tester and 2602-channel digital source (Cleveland, Ohio, jishiliyiqigongsi products) system.
The system also includes a conductive samples, a patented authorization the capacitor (nanoECR) converter and a conductive hardness probe (as shown in Figure 1). The converter can be current, no need to probe connection external conductors, thus maximizing the testing accuracy and repeatability. This "pin" measurement structure ensures safety contact, help to reduce the possible sources of error.Figure 1. Simultaneous measurement of nano-materials and devices, mechanical properties and electrical characteristics of the test system block diagram
The system also includes a fully integrated data acquisition system, support for pressure-displacement and current-voltage measurement real-time correlation between.
Users in this acquisition system connected to the secondary instrument, for real-time measurement and extract the other required parameters. Through its user interface can be very wide load and displacement control condition easily configure all test variables. This characteristic benefit from digital source onboard test script processor, it automatically runs the test sequences for other hardware components provide synchronization, minimize system between the various parts of the problem of timing/control.System operation
During testing, the probe was advanced to the sample surface, while continuous monitoring displacement.
Under pressure and displacement data can be directly calculated from a sample of hardness and modulus. For electrical parameters, Keithley digital source table Wizard radio load a bias, test devices (DUT) and imported radio implementation electrical coupling. When conducting hardness probes Pierce material, the system can be continuous measurement of current, voltage, pressure and displacement.Pressure-driven/displacement detection functionality through static electricity-driven converter, measured with extremely low noise and high sensitivity.
Converter/probe combination installation in piezoelectric positioning system, has realized the sample topology of scanning probe microscopy (SPM) imaging and very precise positioning of the test.In a typical measurement process, the number one channel of the source table for the source and the measurement operation, another channel for current to voltage amplifier, current data is transferred to the control computer.
Control software is extremely flexible, allowing the user to specify the source and measure the current and voltage amplitude for predefined pressure or displacement point I-V scan. The user interface by nanoECR software controls all functions of digital source table, no need to manually modify the parameters on the instrument itself. By virtue of the software's flexibility and automation of test routines, user without the need for manual operation, to test a sample of the most challenging. Test time height depends on the user-defined variables, but the ordinary test sequence time consuming only about 1 minute.Hysitron nanoECR system resolution, accuracy and noise indicators are:
Pressure resolution: 1nN
Pressure from white noise: 100nN
Displacement resolution: 0.04nm
Displacement of white noise: 0.2nm
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